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This paper makes two contributions. First, we present a novel method of leveraging controlled electromagnetic pulses to attack modern computers using second-order effects of induced faults across multiple components of the target computer. Second, we present the design and implementation of BADFET: a low-cost, high-performance pulsed EMFI platform. We aim to share BADFET with the research community in order to democratize future EMFI research. Using these two contributions, we present a reliable and effective attack against a widely used TrustZone-based secure boot implementation on a multi-core 1Ghz+ ARM embedded system.